DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Combination of SECDED with a redundancy technique can effectively tolerate a high variation-induced defect rate in future processes. However, while a defective cell in a block can...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Because of its excellent bit-error-rate performance, the Low-Density Parity-Check (LDPC) decoding algorithm is gaining increased attention in communication standards and literatur...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
The design of ubiquitous and embedded computers focuses on cost factors such as area, power-consumption, and performance. Security and trust properties, on the other hand, are oft...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
plementation from Abstract Architecture Models Ahmed Amine Jerraya TIMA Laboratory - 46, av. Félix Viallet - 38031 Grenoble – France
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
As the hardware and software complexity grows, it is unlikely for the power management hardware/software to have a full observation of the entire system status. In this paper, we ...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Design of low-voltage high-resolution MOSFET-only pipeline analog to digital converters (ADCs) has been investigated in this work. The nonlinearity caused by replacing linear MIM ...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper presents a built-in self-test (BiST) scheme for analog to digital converters (ADC) based on a linear ramp generator and efficient output analysis. The proposed analysi...