DAC
2008
ACM
14 years 6 months ago
2008
ACM
This paper presents a new type of sequential technology independent synthesis. Building on the previous notions of combinational observability and sequential equivalence, sequenti...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Recent advances in digital microfluidics have enabled lab-on-a-chip devices for DNA sequencing, immunoassays, clinical chemistry, and protein crystallization. Basic operations suc...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
In this paper, we present DeFer -- a fast, high-quality and nonstochastic fixed-outline floorplanning algorithm. DeFer generates a non-slicing floorplan by compacting a slicing fl...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Temperature hot-spots have been known to cause severe reliability problems and to significantly increase leakage power. The register file has been previously shown to exhibit the ...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
DAC
2008
ACM
14 years 6 months ago
2008
ACM
In this paper, a novel automatic approach for the concurrent topology and routing optimization that achieves a high quality network layout is proposed. This optimization is based ...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Achieving high performance under a peak temperature limit is a first-order concern for VLSI designers. This paper presents a new model of a thermally-managed system, where a stoch...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
Concurrent interaction of multi-processor systems result in errors which are difficult to find. Traditional simulationbased verification techniques remove the concurrency informat...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...