AAAI
1994
13 years 6 months ago
1994
This paper presents a novel approach to diagnosis which addresses the two problems - computational complexity of abduction and device models - that have prevented model-based diag...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
IC manufacturing process variations are typically expressed in terms of joint probability density functions (jpdf’s) or as worst case combinations/corners of the device model pa...
ICCAD
2003
IEEE
13 years 10 months ago
2003
IEEE
As research begins to explore potential nanotechnologies for future post-CMOS integrated systems, modeling and simulation environments must be developed that can accommodate the c...