TCAD
2008
13 years 4 months ago
2008
As CMOS technology is scaled down toward the nanoscale regime, drastically growing leakage currents and variations in device characteristics are becoming two important design chall...
ASPDAC
2000
ACM
13 years 9 months ago
2000
ACM
We propose a circuit performance oriented device optimization methodology using pre-silicon parameters and critical paths which represent the performance of the chip. Based on our...