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DFT
1997
IEEE
108views VLSI» more  DFT 1997»
13 years 8 months ago
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations
The paper presents a test pattern generation and fault simulation methodology for the detection of catastrophic faults in analogue circuits. The test methodology chosen for evalua...
Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Ma...
HPCA
2009
IEEE
14 years 5 months ago
Eliminating microarchitectural dependency from Architectural Vulnerability
The Architectural Vulnerability Factor (AVF) of a hardware structure is the probability that a fault in the structure will affect the output of a program. AVF captures both microa...
Vilas Sridharan, David R. Kaeli