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ATS
1998
IEEE
113views Hardware» more  ATS 1998»
13 years 9 months ago
Testing and Diagnosis of Interconnect Structures in FPGAs
Since Field programmable gate arrays (FPGAs) are reprogrammable, faults in them can be easily toleruted once fault sites are located. Previous researches on diagnosis of FPGAs mai...
Sying-Jyan Wang, Chao-Neng Huang
ASPDAC
2004
ACM
151views Hardware» more  ASPDAC 2004»
13 years 10 months ago
Combinatorial group testing methods for the BIST diagnosis problem
— We examine an abstract formulation of BIST diagnosis in digital logic systems. The BIST diagnosis problem has applications that include identification of erroneous test vector...
Andrew B. Kahng, Sherief Reda