ATS 1998 - PDF Preprint Papers

ATS 1998 Asian Test Symposium

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ATS
1998
IEEE

170views Hardware» more ATS 1998»

A Ring Architecture Strategy for BIST Test Pattern Generation

13 years 8 months ago

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This paper presents a new effective Built-In Self Test (BIST) scheme that achieves 100% fault coverage with low area overhead, and without any modification of the circuit under tes...

Christophe Fagot, Olivier Gascuel, Patrick Girard,...

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Id	Views	Title	Status

1	170	A Ring Architecture Strategy for BIST Test Pattern Generation	claim
2	114	Design and Simulation of a RISC-Based 32-bit Embedded On-Board Computer	claim
3	113	Testing and Diagnosis of Interconnect Structures in FPGAs	claim
4	112	Integrated Current Sensing Device for Micro IDDQ Test	claim
5	106	A Test Pattern Generation Algorithm Exploiting Behavioral Information	claim
6	91	Special ATPG to Correlate Test Patterns for Low-Overhead Mixed-Mode BIST	claim
7	84	A BIST Structure to Test Delay Faults in a Scan Environment	claim
8	76	Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits	claim

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