ITC
1993
IEEE
13 years 9 months ago
1993
IEEE
This paper describes a technique which uses the Differential Non Linearity (DNL) test data for fault location and identification of the analog components of a flash ADC. In a flash...
ISCAS
2008
IEEE
13 years 11 months ago
2008
IEEE
—In this paper a new ADC architecture of flash type is proposed. This proposed N-bit flash ADC replaces the (2N -1)-toN encoder with two (2N/2 -1)-to-(N/2) encoders to accomplish...