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    ITC
    1996
    IEEE
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    Test Generation for Global Delay Faults
    13 years 9 months ago
    Test Generation for Global Delay Faults
    Download  faculty.cs.tamu.edu
    This paper describes test generation for delay faults caused by global process disturbances. The structural and spatial correlation between path delays is used to reduce the numbe...
    G. M. Luong, D. M. H. Walker
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