ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors ap...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
In this paper, we propose a new approach for VLSI interconnect global routing that can optimize both congestion and delay, which are often competing objectives. Our approach provi...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
— Sub-micron feature sizes have resulted in a considerable portion of power to be dissipated on the buses, causing an increased attention on savings for power at the behavioral l...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
––In this paper, a corner block list — a new efficient topological representation for non-slicing floorplan is proposed with applications to VLSI floorplan and building block...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
Most hardware description frameworks, whether schematic or textual, use cooperating finite state machines (CFSM) as the underlying abstraction. In the CFSM framework, a designer ...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
computation and automatic abstraction. Second, Ketchum performs not only automatic test generation but also unreachability analysis, which enables the test generation effort to be ...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
— Fault diagnosis has particular importance in the context of field programmable gate arrays (FPGAs) because faults can be avoided by reconfiguration at almost no real cost. Cl...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE