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    ITC
    1995
    IEEE
    98views Hardware» more  ITC 1995»
    Improved Boundary Scan Design
    13 years 8 months ago
    Improved Boundary Scan Design
    Download  www.itcprogramdev.org
    Lee Whetsel
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    ITC
    1995
    IEEE
    122views Hardware» more  ITC 1995»
    A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
    13 years 8 months ago
    A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
    Download  www.tet.uni-hannover.de
    A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits ...
    Stefan Weiner
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    ITC
    1995
    IEEE
    104views Hardware» more  ITC 1995»
    Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST
    13 years 8 months ago
    Synthesis of Mapping Logic for Generating Transformed Pseudo-Random Patterns for BIST
    Download  www-crc.stanford.edu
    During built-in self-test (BIST), the set of patterns generated by a pseudo-random pattern generator may not provide a sufficiently high fault coverage. This paper presents a new ...
    Nur A. Touba, Edward J. McCluskey
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    ITC
    1995
    IEEE
    124views Hardware» more  ITC 1995»
    An Experimental Chip to Evaluate Test Techniques: Experiment Results
    13 years 8 months ago
    An Experimental Chip to Evaluate Test Techniques: Experiment Results
    Download  www-crc.stanford.edu
    This paper describes the testing of a chip especially designed to facilitate the evaluation of various test techniques for combinational circuitry. The different test sets and tes...
    Siyad C. Ma, Piero Franco, Edward J. McCluskey
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    ITC
    1995
    IEEE
    102views Hardware» more  ITC 1995»
    Visualizing Quality
    13 years 8 months ago
    Visualizing Quality
    Download  davis.wpi.edu
    Real-world data is known to be imperfect, suffering from various forms of defects such as sensor variability, estimation errors, uncertainty, human errors in data entry, and gaps ...
    Solomon Max
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    ITC
    1995
    IEEE
    107views Hardware» more  ITC 1995»
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
    13 years 8 months ago
    Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing
    Download  www.ece.mcgill.ca
    Xavier Haurie, Gordon W. Roberts
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    ITC
    1995
    IEEE
    116views Hardware» more  ITC 1995»
    An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design
    13 years 8 months ago
    An Experimental Chip to Evaluate Test Techniques: Chip and Experiment Design
    Download  www-crc.stanford.edu
    An experiment has been designed to evaluate multiple testing techniques for combinational circuits. To perform the experiment, a 25k gate CMOS Test Chip has been designed, manufac...
    Piero Franco, William D. Farwell, Robert L. Stokes...
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    ITC
    1995
    IEEE
    95views Hardware» more  ITC 1995»
    Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
    13 years 8 months ago
    Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST
    Download  cadlab.ece.ucsb.edu
    Kwang-Ting Cheng, Chih-Jen Lin
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