ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
A 25k gate Test Chip was designed and manufactured to evaluate different test methods for scan-designed circuits. The design of the chip, the experiment, and preliminary experimen...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
The detectability of delay flaws can be improved by testing CMOS IC's with a very low supply voltage -between 2 and 2.5 times the threshold voltage Vt of the transistors. A d...