ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Tri-state buses and pass transistor logic are used in many complex applications to achieve high performance and small area. Such circuits often contain logic requiring one-hot sig...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
The detection of cell stability and data retention faults in SRAMs has been a time consuming process. In this paper we discuss a new design for test technique called Weak Write Tes...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
A deterministic BIST scheme is presented which requires less hardware overhead than pseudo-random BIST but obtains better or even complete fault coverage at the same time. It take...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Analysis of IC technology trends indicates that Iddq testing may be approaching its limits of applicability. The new concept of the current signature may expand this limit under t...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
This paper presents a new approach for designing test sequences to be generated on–chip. The proposed technique is based on machine learning, and provides a way to generate effi...
ITC
1997
IEEE
13 years 9 months ago
1997
IEEE
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...