TII
2008
13 years 4 months ago
2008
This paper presents a novel modeling analysis of jitter as applicable to testing of serial data channels. Jitter is analyzed by considering separate and combined components. The pr...
DATE
2004
IEEE
13 years 8 months ago
2004
IEEE
In this paper, we propose a simple technique for estimating the standard deviation of a Gaussian random jitter component in a multi-gigahertz signal. This method may utilize exist...
DFT
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper presents a new jitter component analysis method for mixed mode VLSI chip testing in Automatic Test Equipment (ATE). The separate components are analyzed individually an...