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    ITC
    2003
    IEEE
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    Optical and Electrical Testing of Latchup in I/O Interface Circuits
    13 years 10 months ago
    Optical and Electrical Testing of Latchup in I/O Interface Circuits
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    Backside light emission and electrical measurements were used to evaluate the susceptibility to latchup of externally cabled I/O pins for a 0.13 µm technology generation [1,2] te...
    Franco Stellari, Peilin Song, Moyra K. McManus, Ro...
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