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    ASPDAC
    2006
    ACM
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    Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability
    13 years 8 months ago
    Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability
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    Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand...
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