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ASPDAC
2006
ACM

Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability

13 years 8 months ago
Low-overhead design of soft-error-tolerant scan flip-flops with enhanced-scan capability
Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand
Added 20 Aug 2010
Updated 20 Aug 2010
Type Conference
Year 2006
Where ASPDAC
Authors Ashish Goel, Swarup Bhunia, Hamid Mahmoodi-Meimand, Kaushik Roy
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