DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Economic testing of small devices like LCD drivers is a real challenge. In this paper we describe an approach where a production tester is extended by a memory test engine (MTE). ...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Embedded memory quality is critical to overall chip quality. New defect mechanisms that occur at advanced process nodes (65nm and below) are often more pronounced in memories due ...