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DATE
2009
IEEE
78views Hardware» more  DATE 2009»
9 years 8 months ago
QC-Fill: An X-Fill method for quick-and-cool scan test
— In this paper, we present an X-Fill (QC-Fill) method for not only slashing the test time but also reducing the test power (including both capture power and shifting power). QC-...
Chao-Wen Tzeng, Shi-Yu Huang
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