AR
2008
13 years 4 months ago
2008
In this paper we describe the use of design patterns as a basis for creating a Humanoid Walking Pattern Generator Software having a modular architecture. This architecture made po...
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
IROS
2006
IEEE
13 years 10 months ago
2006
IEEE
— A biped walking pattern generator which allows an additional ZMP control (auxiliary ZMP) is presented. An auxiliary ZMP is realized by an inverse system added to a pattern gene...
DSD
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...