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VTS
2000
IEEE
97views Hardware» more  VTS 2000»
13 years 9 months ago
A Low-Speed BIST Framework for High-Performance Circuit Testing
Testing of high performance integrated circuits is becoming increasingly a challenging task owing to high clock frequencies. Often testers are not able to test such devices due to...
Hans G. Kerkhoff, Mansour Shashaani, Manoj Sachdev
GLVLSI
2003
IEEE
180views VLSI» more  GLVLSI 2003»
13 years 10 months ago
3D direct vertical interconnect microprocessors test vehicle
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...
John Mayega, Okan Erdogan, Paul M. Belemjian, Kuan...