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    DAC
    2007
    ACM
    172views Computer Architecture» more  DAC 2007»
    Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
    14 years 5 months ago
    Confidence Scalable Post-Silicon Statistical Delay Prediction under Process Variations
    Download  www.ece.umn.edu
    Due to increased variability trends in nanoscale integrated circuits, statistical circuit analysis has become essential. We present a novel method for post-silicon analysis that g...
    Qunzeng Liu, Sachin S. Sapatnekar
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