ITC
1994
IEEE
13 years 9 months ago
1994
IEEE
Previous approaches to designing random pattern testable circuits use post-synthesis test point insertion to eliminate random pattern resistant (r.p.r.) faults. The approach taken...
ITC
1996
IEEE
13 years 9 months ago
1996
IEEE
Abstract. In complex systems, embedded processors may be used to run software routines for test pattern generation and response evaluation. For system components which are not comp...
3DIM
2007
IEEE
13 years 11 months ago
2007
IEEE
In this paper, we present a novel approach for extracting silhouettes by using a particular pattern that we call the random pattern. The volume intersection method reconstructs th...