Sciweavers

DAC
2000
ACM
13 years 9 months ago
Modeling and simulation of real defects using fuzzy logic
Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the trad...
Amir Attarha, Mehrdad Nourani, Caro Lucas
ICDAR
2009
IEEE
13 years 11 months ago
A Dual Taxonomy for Defects in Digitized Historical Photos
Old photos may be affected by several types of defects. Manual restorers use their own taxonomy to classify damages by which a photo is affected, in order to apply the proper rest...
Edoardo Ardizzone, A. De Polo, Haris Dindo, Giusep...