Sciweavers

ATS
2003
IEEE
126views Hardware» more  ATS 2003»
13 years 10 months ago
Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces
Abstract: As a result of variations in the fabrication process, different memory components are produced with different operational characteristics, a situation that complicates th...
Zaid Al-Ars, A. J. van de Goor