VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
VTS
2005
IEEE
13 years 10 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
We report the successful application of a resistive bridging fault (RBF) simulator to industrial benchmark circuits. Despite the slowdown due to the consideration of the sophistic...