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    ASPDAC
    1995
    ACM
    130views Hardware» more  ASPDAC 1995»
    Design for testability using register-transfer level partial scan selection
    13 years 8 months ago
    Design for testability using register-transfer level partial scan selection
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    Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
    Akira Motohara, Sadami Takeoka, Toshinori Hosokawa...
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