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ASPDAC
1995
ACM
130views Hardware» more  ASPDAC 1995»
10 years 4 months ago
Design for testability using register-transfer level partial scan selection
Abstract - An approach to top down design for testability using register-transfer level(RTL) partial scan selection is described. We propose a scan selection technique based on tes...
Akira Motohara, Sadami Takeoka, Toshinori Hosokawa...
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