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    ISQED
    2006
    IEEE
    153views Hardware» more  ISQED 2006»
    Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
    13 years 10 months ago
    Improving Transient Error Tolerance of Digital VLSI Circuits Using RObustness COmpiler (ROCO)
    Download  esdat.ucsd.edu
    Due to aggressive technology scaling, VLSI circuits are becoming increasingly susceptible to transient errors caused by single-event-upsets (SEUs). In this paper, we introduce two...
    Chong Zhao, Sujit Dey
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