VLSISP
2008
13 years 4 months ago
2008
The study of Multiple Soft errors on memory modules caused by radiation effects represents an interesting field of current research. The fault tolerance of these devices in radiati...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
Logic soft errors are radiation induced transient errors in sequential elements (flip-flops and latches) and combinational logic. Robust enterprise platforms in sub-65nm technolog...