DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Test sets that detect each target fault n times (n-detection test sets) are typically generated for restricted values of n due to the increase in test set size with n. We perform ...
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values ...