Sciweavers

ET
2000
80views more  ET 2000»
13 years 4 months ago
A New Method for Testing Re-Programmable PLAs
: We present a method for obtaining a minimal set of test configurations and their associated set oftest patterns that completely tests re-programmable Programmable Logic Arrays (P...
Charles E. Stroud, James R. Bailey, Johan R. Emmer...
PTS
2000
108views Hardware» more  PTS 2000»
13 years 6 months ago
Determination of Test Configurations for Pair-Wise Interaction Coverage
Systems constructed from components, including distributed systems, consist of a number of elements that interact with each other. As the number of network elements or interchangea...
Alan W. Williams
DATE
1997
IEEE
114views Hardware» more  DATE 1997»
13 years 9 months ago
Compact structural test generation for analog macros
A structural, fault-model based methodology for the generation of compact high-quality test sets for analog macros is presented. Results are shown for an IVconverter macro design....
V. Kaal, Hans G. Kerkhoff
ISCAS
1999
IEEE
105views Hardware» more  ISCAS 1999»
13 years 9 months ago
Configuration self-test in FPGA-based reconfigurable systems
An FPGA-based reconfigurable system may contain boards of FPGAs which are reconfigured for different applications and must work correctly. This paper presents a novel approach for...
W. Quddus, Abhijit Jas, Nur A. Touba
ETS
2007
IEEE
109views Hardware» more  ETS 2007»
13 years 11 months ago
Test Configurations for Diagnosing Faulty Links in NoC Switches
The paper proposes a new concept of diagnosing faulty links in Network-on-a-Chip (NoC) designs. The method is based on functional fault models and it implements packet address dri...
Jaan Raik, Raimund Ubar, Vineeth Govind