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ATS
2003
IEEE
75views Hardware» more  ATS 2003»
13 years 10 months ago
An Enhanced Test Generator for Capacitance Induced Crosstalk Delay Faults
Capacitive crosstalk can give rise to slowdown of signals that can propagate to a circuit output and create a functional error. A test generation methodology, called XGEN, was dev...
Arani Sinha, Sandeep K. Gupta, Melvin A. Breuer
GLVLSI
2006
IEEE
95views VLSI» more  GLVLSI 2006»
13 years 11 months ago
Test generation using SAT-based bounded model checking for validation of pipelined processors
Functional verification is one of the major bottlenecks in microprocessor design. Simulation-based techniques are the most widely used form of processor verification. Efficient ...
Heon-Mo Koo, Prabhat Mishra
VLSID
2009
IEEE
115views VLSI» more  VLSID 2009»
14 years 5 months ago
Efficient Techniques for Directed Test Generation Using Incremental Satisfiability
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
Prabhat Mishra, Mingsong Chen