Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
ÐPseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detecta...
Rajagopalan Srinivasan, Sandeep K. Gupta, Melvin A...
Existing built-in self test (BIST) strategies require the use of specialized test pattern generation hardware which introduces signicant area overhead and performance degradation...
Accumulators based on addition or subtraction can be used as test pattern generators. Some circuits, however, require long test lengths if the parameters of the accumulator are no...