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ITC
1991
IEEE
80views Hardware» more  ITC 1991»
9 years 9 months ago
An Intelligent Approach to Automatic Test Equipment
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
William R. Simpson, John W. Sheppard
GECCO
2006
Springer
213views Optimization» more  GECCO 2006»
9 years 9 months ago
Evolutionary unit testing of object-oriented software using strongly-typed genetic programming
Evolutionary algorithms have successfully been applied to software testing. Not only approaches that search for numeric test data for procedural test objects have been investigate...
Stefan Wappler, Joachim Wegener
EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
9 years 10 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero
SBCCI
2005
ACM
185views VLSI» more  SBCCI 2005»
9 years 11 months ago
Automatic generation of test sets for SBST of microprocessor IP cores
Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Cur...
Ernesto Sánchez, Matteo Sonza Reorda, Giova...
VTS
2007
IEEE
103views Hardware» more  VTS 2007»
9 years 11 months ago
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester
In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore,...
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
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