At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester

In SoC designs, limited test access to internal cores, lowcost external tester’s lack of accuracy and slow frequencies make application of at-speed tests impractical. Therefore, this paper presents an embedded micro-tester for testing IEEE1500-compliant SoCs. In the proposed approach, the test program is no more executed by the external tester but by the embedded micro-tester. Under the control of the embedded SoC microprocessor, the micro-tester executes the test programs stored outside of the SoC in an external memory. The micro-tester supports stuck-at testing as well as both atspeed testing techniques: Launch-On-Last-Shift (LOLS) and Launch-On-Capture (LOC). Using the ITC’02 benchmarks, experimental results are presented: test application time, test data volume and area overhead.

• Type: Conference
• Year: 2007
• Where: VTS
• Authors: Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
• Keywords: Embedded Micro-tester, External Tester, Test Programs, VTS 2007