AUSAI
2008
Springer
13 years 7 months ago
2008
Springer
Abstract. Bias variance decomposition for classifiers is a useful tool in understanding classifier behavior. Unfortunately, the literature does not provide consistent guidelines on...
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
Efficient production testing is frequently hampered because current digital circuits require test sets which are too large. These test sets can be reduced significantly by means...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of eac...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
When a test set size is larger than desired, some patterns must be dropped. This paper presents a systematic method to reduce test set size; the method reorders a test set using t...