DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
IOLTS
2003
IEEE
13 years 10 months ago
2003
IEEE
This paper investigates the behavior of the IEEE 1394 bus in the presence of transient errors in the hardware layers of the protocol. Software-implemented error injection is used ...
EMSOFT
2005
Springer
13 years 10 months ago
2005
Springer
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Transient errors are one of the major reasons for system downtime in many systems. While prior research has mainly focused on the impact of transient errors on datapath, caches an...
DFT
2007
IEEE
13 years 11 months ago
2007
IEEE
We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry....
IEEEPACT
2008
IEEE
13 years 11 months ago
2008
IEEE
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...