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DSN
2004
IEEE
11 years 9 months ago
The Recursive NanoBox Processor Grid: A Reliable System Architecture for Unreliable Nanotechnology Devices
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...
A. J. KleinOsowski, Kevin KleinOsowski, Vijay Rang...
ASPDAC
2007
ACM
98views Hardware» more  ASPDAC 2007»
11 years 9 months ago
Cyclic-CPRS : A Diagnosis Technique for BISTed Circuits for Nano-meter Technologies
- A Cyclic-CPRS (Column Parity Row Selection) technique is presented to diagnose built-in self tested (BISTed) circuits, even in the presence of many unknowns and transient errors....
Chun-Yi Lee, Hung-Mao Lin, Fang-Min Wang, James Ch...
IOLTS
2003
IEEE
97views Hardware» more  IOLTS 2003»
11 years 10 months ago
Error-Injection-Based Failure Characterization of the IEEE 1394 Bus
This paper investigates the behavior of the IEEE 1394 bus in the presence of transient errors in the hardware layers of the protocol. Software-implemented error injection is used ...
D. J. Beauregard, Zbigniew Kalbarczyk, Ravishankar...
EMSOFT
2005
Springer
11 years 11 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
DATE
2005
IEEE
136views Hardware» more  DATE 2005»
11 years 11 months ago
Increasing Register File Immunity to Transient Errors
Transient errors are one of the major reasons for system downtime in many systems. While prior research has mainly focused on the impact of transient errors on datapath, caches an...
Gokhan Memik, Mahmut T. Kandemir, Ozcan Ozturk
DFT
2007
IEEE
135views VLSI» more  DFT 2007»
11 years 11 months ago
Fault Secure Encoder and Decoder for Memory Applications
We introduce a reliable memory system that can tolerate multiple transient errors in the memory words as well as transient errors in the encoder and decoder (corrector) circuitry....
Helia Naeimi, André DeHon
IEEEPACT
2008
IEEE
11 years 11 months ago
Skewed redundancy
Technology scaling in integrated circuits has consistently provided dramatic performance improvements in modern microprocessors. However, increasing device counts and decreasing o...
Gordon B. Bell, Mikko H. Lipasti
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