ASPLOS
2012
ACM
12 years 20 days ago
2012
ACM
Future microprocessors need low-cost solutions for reliable operation in the presence of failure-prone devices. A promising approach is to detect hardware faults by deploying low-...
ECSA
2011
Springer
12 years 4 months ago
2011
Springer
Abstract. An important step in achieving robustness to run-time faults is the ability to detect and repair problems when they arise in a running system. Effective fault detection a...
CODES
2011
IEEE
12 years 4 months ago
2011
IEEE
Reliability is a major requirement for most safety-related systems. To meet this requirement, fault-tolerant techniques such as hardware replication and software re-execution are ...
TPDS
2010
12 years 11 months ago
2010
The importance of transient faults is predicted to grow due to current technology trends of increased scale of integration. One of the components that will be significantly affecte...
CODES
2010
IEEE
13 years 1 months ago
2010
IEEE
This paper presents an approach to system-level optimization of error detection implementation in the context of fault-tolerant realtime distributed embedded systems used for safe...
FTCS
1996
13 years 6 months ago
1996
In the research reported in this paper, transient faults were injected in the nodes and in the communication subsystem (by using software fault injection) of a commercial parallel...
FTCS
1997
13 years 6 months ago
1997
In this paper the consolidate identification of faults, distinguished as transient or permanent/intermittent, is approached. Transient faults discrimination has long been performe...
DAC
2005
ACM
13 years 6 months ago
2005
ACM
1 This paper presents a transient faults sensitivity evaluation for Quasi Delay Insensitive (QDI) asynchronous circuits. Because of their specific architecture, asynchronous circui...
DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
The progression of implementation technologies into the sub-100 nanometer lithographies renew the importance of understanding and protecting against single-event upsets in digital...
DSN
2004
IEEE
13 years 8 months ago
2004
IEEE
Advanced molecular nanotechnology devices are expected to have exceedingly high transient fault rates and large numbers of inherent device defects compared to conventional CMOS de...