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ISCAS
2005
IEEE
153views Hardware» more  ISCAS 2005»
13 years 10 months ago
A two-step DDEM ADC for accurate and cost-effective DAC testing
— This paper presents a scheme for testing DACs’ static non-linearity errors by using a two-step flash ADC with deterministic dynamic element matching (DDEM). In this work, the...
Hanqing Xing, Degang Chen, Randall L. Geiger