VLSID
2009
IEEE
14 years 4 months ago
2009
IEEE
Abstract— This paper introduces a fuzzy logic based guidance architecture to a graph grammar framework for automated design of analog circuits. The grammar generates circuit topo...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
The current paradigm of using Cu interconnects for on-chip global communication is rapidly becoming a serious performance bottleneck in ultra-deep submicron (UDSM) technologies. C...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
We propose a novel dependable SRAM with 7T cells and their array structure that avoids a half-selection problem. In addition, we introduce a new concept, "quality of a bit (Q...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
Increasing the number of cores in a multi-core processor reduces per-core performance. On the other hand, providing more resources to each core limits the number of cores on a chi...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
Power density has been increasing at an alarming rate in recent processor generations resulting in high on-chip temperature. Higher temperature results in poor reliability and inc...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
Abstract-- Single-ended static random access memory (SESRAM) is well known for their tremendous potential of low active power and leakage dissipations. In this paper, we present a ...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
Abstract--Digital control for embedded systems often requires low-power, hard real-time computation to satisfy high control-loop bandwidth, low latency, and low-power requirements....
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
Functional validation is a major bottleneck in the current SOC design methodology. While specification-based validation techniques have proposed several promising ideas, the time ...
VLSID
2009
IEEE
14 years 10 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...