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    DATE
    2009
    IEEE
    148views Hardware» more  DATE 2009»
    A new design-for-test technique for SRAM core-cell stability faults
    13 years 11 months ago
    A new design-for-test technique for SRAM core-cell stability faults
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    —Core-cell stability represents the ability of the core-cell to keep the stored data. With the rapid development of semiconductor memories, their test is becoming a major concern...
    Alexandre Ney, Luigi Dilillo, Patrick Girard, Serg...
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