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12

ITC
1999
IEEE

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Fault diagnosis in scan-based BIST using both time and space information

13 years 9 months ago

Fault diagnosis in scan-based BIST using both time and space information

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Jayabrata Ghosh-Dastidar, Debaleena Das, Nur A. To

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Hardware | ITC 1999 |

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Added	04 Aug 2010
Updated	04 Aug 2010
Type	Conference
Year	1999
Where	ITC
Authors	Jayabrata Ghosh-Dastidar, Debaleena Das, Nur A. Touba

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