Mixed PLB and Interconnect BIST for FPGAs Without Fault-Free Assumptions

We tackle the problem of fault-free assumptions in current PLB and interconnect built-in-self-test (BIST) techniques for FPGAs. These assumptions were made in order to develop strong BIST methods for one class of components (PLBs or interconnects) while assuming that the other class is fault-free. This results in a cyclical conundrum that renders current PLB and interconnect BIST techniques impractical, since current deepsubmicron FPGAs as well as those of emerging single-digit nanometer technologies are expected to have a profusion of hard (permanent) PLB as well as interconnect faults. We address this issue here and develop a novel method M-BIST that uses a combination of (i) iterative bootstrapping that without any knowledge of the state of any PLB or interconnect determines a minimum contingent of fault-free test circuit components with high probability, and (ii) mixed testing of PLBs and interconnects in an interleaved manner that identifies fault-free components that are used in...

• Type: Conference
• Year: 2006
• Where: VTS
• Authors: Vishal Suthar, Shantanu Dutt
• Keywords: BIST Techniques, Current Plb, Interconnects, VTS 2006