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14

ITC
2003
IEEE

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DFFT : Design For Functional Testability

13 years 10 months ago

DFFT : Design For Functional Testability

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Creating functional tests that work on an ATE has always been a significant challenge [1]. This paper identifies the fundamental mechanisms for functional test failures of an SOC on an ATE. Taking these mechanisms into account during the design process of a chip can substantially reduce the efforts needed to make functional tests work. We call this process design for functional testability (DFFT).

Haluk Konuk, Leon Xiao

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Functional Test Failures | Functional Tests | Fundamental Mechanisms | Hardware | ITC 2003 |

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ITC
Authors	Haluk Konuk, Leon Xiao

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