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13

ITC
2003
IEEE

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On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs

13 years 10 months ago

On Reducing Test Data Volume and Test Application Time for Multiple Scan Chain Designs

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Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	ITC
Authors	Huaxing Tang, Sudhakar M. Reddy, Irith Pomeranz

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