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7

ITC
2002
IEEE

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Screening MinVDD Outliers Using Feed-Forward Voltage Testing

13 years 9 months ago

Screening MinVDD Outliers Using Feed-Forward Voltage Testing

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Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchi

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Added	15 Jul 2010
Updated	15 Jul 2010
Type	Conference
Year	2002
Where	ITC
Authors	Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner

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