2 search results - page 1 / 1 » Screening MinVDD Outliers Using Feed-Forward Voltage Testing |
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
ITC
2003
IEEE
13 years 10 months ago
2003
IEEE
Very Deep Sub-Micron (VDSM) defects are resolved as Statistical Post-Processing™ (SPP) outliers of a new IDDQ screen. The screen applies an IDDQ pattern once to the Device Under...