Semi-analytical techniques for substrate characterization in the design of mixed-signal ICs

A number of methods are presentedfor highly efficient calculation of substratecurrenttransport. A three-dimensionalGreen'sFunction based substrate representation, in combination with the use of the Fast Fourier Transform, significantly speeds up the computation of sensitivities with respect to all parameters associated with a given architecture. Substrate sensitivity analysis is used in a number of physicaloptimization tools, such as placementand trend analysis for the estimation of the impact of technology migration and/or layout re-design.

• Type: Conference
• Year: 1996
• Where: ICCAD
• Authors: Edoardo Charbon, Ranjit Gharpurey, Alberto L. Sangiovanni-Vincentelli, Robert G. Meyer
• Keywords: Fast Fourier Transform, Hardware, ICCAD 1996, Substrate Representation, Substrate Sensitivity Analysis