Sciweavers

DAC
1992
ACM

SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits

13 years 9 months ago
SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits
Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
Added 10 Aug 2010
Updated 10 Aug 2010
Type Conference
Year 1992
Where DAC
Authors Kuen-Jong Lee, Charles Njinda, Melvin A. Breuer
Comments (0)