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    ITC
    1989
    IEEE
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    Prototype Testing Simplified by Scannable Buffers and Latches

    13 years 9 months ago
    Prototype Testing Simplified by Scannable Buffers and Latches
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    Andy Halliday, Greg Young, Alfred L. Crouch
    claim paper
    Added 11 Aug 2010
    Updated 11 Aug 2010
    Type Conference
    Year 1989
    Where ITC
    Authors Andy Halliday, Greg Young, Alfred L. Crouch
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